X-Ray Analysis
X-Ray Photoelectron Spectroscopy (XPS)
Brand/Model
ULVAC-PHI / PHI 5000 VersaProbe II
Applications
Measure the elemental composition at the parts per thousand range, empirical formula, chemical state, and electronic state of the elements that exist within a material
Type of Samples
Solids ranging from film and powder samples
Country of Origin
United States of America (USA)
Specifications
- X-ray source : Aluminum (Al)
- Photon energy : 1486.6
Package | Description | Unit | UMPSA Price | External Price |
|---|---|---|---|---|
1 | Survey scan | per sample | RM 100.00 | RM 200.00 |
2 | Survey scan + Narrow scan | per sample | RM 300.00 | RM 400.00 |
3 | Survey scan + Narrow scan + Fitting | per sample | RM 400.00 | RM 500.00 |
4 | Survey + Narrow + Mapping + Line + Fitting | per sample | RM 600.00 | RM 700.00 |
For further information, please contact:
Ms. Azra | +6012-945 9325 | nurulazra@umpsa.edu.my
Ms. Azra | +6012-945 9325 | nurulazra@umpsa.edu.my
X-Ray Powder Diffractometer (XRD)
Brand/Model
PANalytical / X’Pert³ Powder
Applications
XRD is used for the identification of unknown crystalline materials
Type of Samples
Minerals and inorganic compounds
Country of Origin
Netherlands
Specifications
-
Anode material: Cu
-
Angle range : 3° to 150°
-
Max voltage : 15 to 52 kV
-
Max current : 5 to 60 mA
-
Data analysis software : HighScore Plus
-
Database : Inorganic Crystal Structure Database – ICSD
Package | Description | Unit | UMPSA Price | External Price |
|---|---|---|---|---|
1 | Phase identification | per sample | RM 150.00 | RM 200.00 |
2 | Phase identification + quantification | per sample | RM 180.00 | RM 220.00 |
For further information, please contact:
Ms. Azra | +6012-945 9325 | nurulazra@umpsa.edu.my
Ms. Azra | +6012-945 9325 | nurulazra@umpsa.edu.my
Wavelength Dispersive X-Ray Fluorescence (WD-XRF)
Brand/Model
Rigaku / ZSX Primus II
Applications
XRF is a non-destructive analytical technique used to determine the elemental composition of materials
Type of Samples
Powder, liquid, and film samples
Country of Origin
Japan
Specifications
- X-ray material : Rhodium (Rh)
- Crystal : LiF (200)
- Voltage : 50 kV
- Current : 60 mA
- Features:
- Analysis of elements from Be to Pu- Tube above optics minimizes contamination issues- Micro analysis to analyze samples as small as 500 µm
Package | Description | Unit | UMPSA Price | External Price |
|---|---|---|---|---|
1 | Elemental analysis | per sample | RM 150.00 | RM 180.00 |
2 | Oxide group analysis | per sample | RM 150.00 | RM 180.00 |
3 | Combination of elemental & oxide group analysis | per sample | RM 200.00 | RM 230.00 |
For further information, please contact:
Ms. Azra | +6012-945 9325 | nurulazra@umpsa.edu.my
Ms. Azra | +6012-945 9325 | nurulazra@umpsa.edu.my
